Erica J. Van Loon, Head of Glaser Weil’s Trademark, Copyright and Media Practice, will be moderating a panel at the upcoming LAIPLA Spring Seminar. This annual three-day event focuses on the latest trends, news and practices within intellectual property. This year’s seminar will be held May 4-6, 2018 in Ojai, California and includes presentations by legal scholars, in-house attorneys and private practitioners.
Ms. Van Loon’s panel, “Common Pitfalls of Trademark Expert Reports and Survey Evidence,” will take place on Saturday, May 5, 2018 at 7:30a.m. This MCLE session will explore leading decisions regarding the admissibility of trademark surveys and provide practical tips on how to avoid common pitfalls in expert reports. The panel will draw on the experience of seasoned trademark litigators and a trademark survey expert to probe the advantages and disadvantages of various survey varieties, such as the Everready and Squirt methods.
Erica J. Van Loon, Glaser Weil, Partner
Amy E Burke, Theodora Oringher, Associate
Cynthia Cohen, Ph.D., Verdict Success LLC, Trademark Survey Expert
Tania Hoff, NBCUniversal, Senior Vice President, Litigation – Head of Television and Feature Film Litigation
Lynda Zadra-Symes, Knobbe Martens, Partner
To learn more or to register, click here or visit the LAIPLA Website.